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Conference Proceedings

1. Comparison of Growth Rate at Oxidation of Si_1-xGe_x Nanowires

S. Kim ; H. Chang ; H. Seong ; H. Choi ; D. Ko

Pub. info.:	Nanotechnology (General) - 213th ECS Meeting. pp.7-12, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(18)

Conference Proceedings

2. Relaxation of Strained Si₁₋xGex by Dry Oxidation

B. Min ; D. Ko ; M. Cho ; T. Lee ; K. Choi

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment. pp.41-52, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(1)

Conference Proceedings

3. A Study on the Formation Processes and Microstructures of Ni-Silicide Films on Epi-Si_1-xC_x

J. Yoo ; H. Chang ; M. Cho ; T. Lee ; D. Ko

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 4 : new materials, processes and equipment. pp.427-432, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(1)

Conference Proceedings

4. Local Temperature in the MEA and Performance in the PEMFC

D. Ko ; C. Moon ; J. Yang ; J. Jeong ; G. Choi

Pub. info.:	Proton exchange membrane fuel cells 8. pp.863-871, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(2)

Conference Proceedings

5. The Study of Hafnium Silicate by NO Gas Annealing Treatment

D. Suh ; D. Lee ; K. Chung ; M. Cho ; D. Ko

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment. pp.129-140, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(1)

Conference Proceedings

6. Fabrication and characterization of InAs quantum dot semiconductor optical amplifiers on InP operating at 1.5 μm

N. Kim ; J. M. Oh ; D. Lee ; S. Pyun ; D. Ko ; J. Yoon ; W. Jeong ; J. Jang

Pub. info.:	Quantum dots, particles, and nanoclusters IV : 22-23 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6481

Conference Proceedings

7. Restoring number of suspended particles in ocean using satellite optical images and forecasting particle fields

V. I. Haltrin ; R. A. Arnone ; P. Flynn ; B. Casey ; A. D. Weidemann ; D. Ko

Pub. info.:	Current research on remote sensing, laser probing, and imagery in natural waters. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6615

Conference Proceedings

8. Polarization sensitive optical coherence tomography for application conditions with external perturbations

V. Tougbaev ; T. Eom ; C. Kee ; D. Ko ; J. Lee

Pub. info.:	Saratov fall meeting 2006 : optical technologies in biophysics and medicine VIII : 26-29 September 2006, Saratov, Russia. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6535

Conference Proceedings

9. Characteristics of InAs/InGaAsP quantum dot laser diodes lasing at 1.55um

E. Lee ; Y. Jang ; N. Kim ; D. Lee ; S. Pyun ; D. Ko ; J. Yoon ; W. Jeong ; J. Jang

Pub. info.:	Novel in-plane semiconductor lasers VI : 22-25 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6485

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Conference Proceedings

10. Forecasting coastal optical properties using ocean color and coastal circulation models

R. A. Arnone ; B. Casey ; D. Ko ; P. Flynn ; L. Carrolo

Pub. info.:	Coastal ocean remote sensing : 26-27 August 2007, San Diego, California, USA. pp.66800S-1-66800S-8, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6680

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Author: D. Ko