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13 results

Conference Proceedings

1. Retrospective processing of DTI tractography to compensate for partial volume effects

D. Hwang ; A. Shetty ; A. Rajagopalan ; M. Singh

Pub. info.:	Medical imaging 2007, Physiology, function, and structure from medical images : 18-20 February 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6511

Conference Proceedings

2. Alkaline Hydroxide Induced High Level of Alkali Metal Concentration Effect on the Characteristics of LTO Layer

J. Kim ; W. Seo ; W. Lee ; D. Hwang ; B. Lee

Pub. info.:	Physical, Analytical, and Spectro-Electrochemistry (General) - 214th ECS Meeting/PRiME 2008. pp.37-42, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(28)

Conference Proceedings

3. The Novel Highly-Selective Etching Process of SiO2 to TiSix for Nano-Scale Device Fabrication

D. Hwang ; K. Kim ; Y. Lee ; S. Chae

Pub. info.:	Solid State (General) - 214th ECS Meeting/PRiME 2008. pp.47-59, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(40)

Conference Proceedings

4. Defect Delineation by Electrochemical Cu Deposition in p-type Si Wafers

K. Kim ; H. Ham ; D. Hwang ; B. Lee

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.213-217, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

5. Characteristic of Junction Leakage Current with Bulk Micro Defect Density in p-n+ Junctions

W. Lee ; J. Kim ; K. Kim ; K. Lee ; D. Hwang

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.219-222, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

6. Evaluation of Surface Defects in Silicon on Insulator using Modified HF Defects and Cu Decoration Method (HCM)

E. Lee ; K. Lee ; D. Hwang ; B. Lee

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.207-212, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

7. Semi-transparent UV-Detecting ZnO-TFTs with Polymer Gate Dielectric

S. Im ; H. Bae ; J. Choi ; D. Hwang ; J. Kim

Pub. info.:	Student Posters (General). pp.29-39, 2006. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(23)

Conference Proceedings

8. Evaluation of litho printability of DRAM contact hole patterns with various programmed defects

K. Seo ; S. Lee ; H. Kim ; D. Hwang ; S. Kim ; G. Jeong ; O. Han ; C. Chen ; D. Yee ; E. Kim ; K. Park ; N. Kim ; S. Choi ; D. Kim ; S. Lohokare

Pub. info.:	Photomask and next-generation lithography mask technology XIV. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6607

Conference Proceedings

9. Recognition of 3D objects by use of computational integral imaging reconstruction

J. Park ; D. Hwang ; D. Shin ; J. Hyun ; J. Lee ; H. Kang ; E. Kim

Pub. info.:	Stereoscopic displays and virtual reality systems XIV : 29-31 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6490

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Conference Proceedings

10. Simultaneous measurement of strain and temperature using a Lyot fiber filter and a fiber Bragg grating in linear configuration

L. V. Nguyen ; D. Hwang ; D. S. Moon ; Y. Chung

Pub. info.:	19th International Conference on Optical Fibre Sensors. 2 pp.70044D-1-70044D-4, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7004

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Author: D. Hwang