1.

Conference Proceedings
Conference Proceedings
1. Simulation and Fabrication of High-Voltage 4H-SiC Diodes with Multiple Floating Guard Ring Termination
Sheridan, D. C. ; Niu, G. ; Merrett, J. N. ; Cressler, J. D. ; Ellis, C. ; Tin, C. C. ; Siergiej, R. R.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1339-1342,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
2.

Conference Proceedings
Conference Proceedings
2. Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs
Jin, Z. ; Johansen, J. A. ; Cressler, J. D. ; Joseph, A. J.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.143-149,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
3.

Conference Proceedings
Conference Proceedings
3. Noise in SiGe HBTs: opportunities and challenges (Keynote Paper)
Cressler, J. D.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.101-119,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
4.

Conference Proceedings
Conference Proceedings
4. Investigating the differences in low-frequency noise behavior of npn and pnp SiGe HBTs fabricated in a complementary SiGe HBT BiCMOS on SOI technology
Zhao, E. ; Krithivasan, R. ; Sutton, A. K. ; Jin, Z. ; Cressler, J. D. ; El-Kareh, B. ; Balster, S. ; Yasuda, H.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.132-142,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
5.

Conference Proceedings
Conference Proceedings
5. Demonstration of Deep (80 μm) RIE Etching of SiC for MEMS and MMIC Applications
Sheridan, D. C. ; Casady, J. B. ; Ellis, E. C. ; Siergiej, R. R. ; Cressler, J. D. ; Strong, R. M. ; Urban, W. M. ; Valek, W. F. ; Seiler, C. F. ; Buhay, H.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1053-1056,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
6.

Conference Proceedings
Conference Proceedings
6. Gamma and Proton Irradiation Effects on 4H-SiC Depletion-Mode Trench JFETs
Merrett, J. N. ; Williams, J. R. ; Cressler, J. D. ; Sutton, A. ; Cheng, L. ; Bondarenko, V. ; Sankin, I. ; Seale, D. ; Mazzola, M. S. ; Krishnan, B. ; Koshka, Y. ; Casady, J. B.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.885-888,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485