1.

Conference Proceedings

Conference Proceedings
Trouileau, C. ; Crastes, A. ; Fieque, B. ; Legras, O. ; Tissot, J.L.
Pub. info.: Sensors, systems, and next-generation satellites IX : 20-22 September 2005, Bruges, Belgium.  pp.597815-597815,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5978
2.

Conference Proceedings

Conference Proceedings
Crastes, A. ; Tissot, J.-L. ; Guimond, Y.M. ; Antonello, P.C. ; Leleve, J. ; Lenz, H.-J. ; Potet, P. ; Yon, J.-J.
Pub. info.: Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France.  pp.272-279,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5251
3.

Conference Proceedings

Conference Proceedings
Fieque, B. ; Crastes, A. ; Legras, O. ; Tissot, J.-L.
Pub. info.: Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA.  pp.531-538,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5783
4.

Conference Proceedings

Conference Proceedings
Tissot, J. L. ; Legros, O. ; Trouilleau, C. ; Crastes, A. ; Fieque, B.
Pub. info.: Electro-optical and infrared systems : technology and applications II : 26-27 September 2005, Bruges, Belgium.  pp.59870N-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5987
5.

Conference Proceedings

Conference Proceedings
Tissot, J. L. ; Trouilleau, C. ; Crastes, A. ; Fieque, B. ; Legras, O.
Pub. info.: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.59640F-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5964
6.

Conference Proceedings

Conference Proceedings
Tissot, J. L. ; Vilain, M. ; Crastes, A. ; Tinnes, S. ; Larre, A. ; Legras, O. ; Yon, J. J.
Pub. info.: Electro-optical and infrared systems : technology and applications : 25-27 October 2004, London, United Kingdom.  pp.72-77,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5612
7.

Conference Proceedings

Conference Proceedings
Trouilleau, C. ; Crastes, A. ; Legras, O. ; Tissot, J. L. ; Chatard, J. P.
Pub. info.: Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA.  pp.578-585,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5783
8.

Conference Proceedings

Conference Proceedings
Oelrich, B. D. ; Crastes, A. ; Underwood, C. I. ; Mackin, S.
Pub. info.: Sensors, systems, and next-generation satellites VIII : 13-15 September 2004, Maspalomas, Gran Canaria, Spain.  pp.209-217,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5570
9.

Conference Proceedings

Conference Proceedings
Trouilleau, C. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Yon, J.-J. ; Astier, A.
Pub. info.: Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France.  pp.129-135,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5251
10.

Conference Proceedings

Conference Proceedings
Fieque, B. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Tinnes, S.
Pub. info.: Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France.  pp.114-120,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5251