1.

Conference Proceedings
Conference Proceedings
1. Effect of Increasing the Boiling Point on the Mesophase Induction Period During Thermal Treatment of Athabasca Bitumen
Cotte, E. ; Fairbridge, C. ; Gentzis, Thomas ; Khulbe, C. ; Nowlan, V. ; Rahimi, Parviz
Pub. info.: AIChE 1999 SPRING NATIONAL MEETING.  1999.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1999
2.

Technical Paper
Technical Paper
2. Establishing New Correlations Between In-Cylinder Charge Motion and Combustion Process in Gasoline Engines Through a Numerical DOE.
Laget, O. ; Cotte, E.
Pub. info.: 2010 SAE world congress : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010
3.

Conference Proceedings
Conference Proceedings
3. Pellicle-induced aberrations and apodization in hyper NA optical lithography [6283-115]
Bubke, K. ; Alles, B ; Cotte, E. ; Sczyrba, M. ; Pierrat, C.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XIII.  pp.628318-628318,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6283
4.

Conference Proceedings
Conference Proceedings
4. Study of stress birefringence for 1 93-nm immersion photomasks [5853-02]
Cotte, E. ; Selle, M. ; Bubke, K. ; Teuber, S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.10-19,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
5.

Conference Proceedings
Conference Proceedings
5. 193-nm immersion photomask image placement in exposure tools [6154-52]
Cotte, E. ; Alles, B. ; Wandel, T. ; Antesberger G ; Teuber S ; Vorwerk M ; Fangen A ; Katzwinkel F
Pub. info.: Optical Microlithography XIX.  pp.61541F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
6.

Conference Proceedings
Conference Proceedings
6. Determination of mask layer stress by placement metrology [5992-130]
Butschke, J. ; Buttgereit, U. ; Cotte, E. ; Hess, G. ; Irmscher, M. ; Seitz, H.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59923U-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
7.

Conference Proceedings
Conference Proceedings
7. Analysis of the Vistec LMS IPRO3 performance and accuracy enhancement techniques [6349-59]
Antesberger, G. ; Knoth, S. ; Laske, F. ; Rudolf, J. ; Cotte, E. ; Alles, B. ; Blasing, C. ; Fricke, W. ; Rinn, K.
Pub. info.: Photomask Technology 2006.  pp.63491M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
8.

Conference Proceedings
Conference Proceedings
8. EUV mask image placement management in writing, registration, and exposure tools [5853-124]
Cotte, E. ; Dersch, U. ; Holfeld, C. ; Mickan, U. ; Seitz, H. ; Leutbecher, T. ; Hess, G.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.336-344,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853