Proceedings : 1999 International Symposium on Microelectronics : 26-28 October 1999, Chicago, Illinois. pp.240-245, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1191-1196, 1997. Zurich, Switzerland. Trans Tech Publications