1.

Conference Proceedings
Conference Proceedings
1. A New Method for Simulation of Injection Molding
Yu, H. ; Cook, P. ; Kietzmann, C. ; Costa, F. ; Xu, S. ; Kennedy, P.
Pub. info.: ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004.  pp.641-644,  2004.  Brookfield Center, Conn..  Society of Plastics Engineers
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 62
2.

Technical Paper
Technical Paper
2. Rapid Prototyping of Generic Hybrid Concept Vehicles.
Cook, P. ; James, P. ; Willows, M.
Pub. info.: 2002 SAE world congress : technical paper.  2002.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2002
3.

Conference Proceedings
Conference Proceedings
3. Behavior of NLO polymer modulators irradiated by gamma rays
Taylor, E. W. ; Nichter, J. E. ; Nash, F. ; Michalak, R. J. ; Haas, F. ; Payson, P. M. ; Cook, P. ; McEwan, T. E. ; McKeon, B. ; Szep, A. A. ; Flushe, B. ; Pirich, A. R. ; Brost, G. A. ; Grote, J. G. ; Zetts, J. S. ; Yaney, P. P. ; Heckman, E.
Pub. info.: Linear and Nonlinear Optics of Organic Materials III.  pp.216-226,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5212
4.

Conference Proceedings
Conference Proceedings
4. Defect printability in CPL mask technology
Kuijten, J.-P. ; Verhappen, A. ; Pijnenburg, W. ; Conley, W. ; Litt, L.C. ; Wu, W. ; Montgomery, P. ; Roman, B.J. ; Kasprowicz, B.S. ; Progler, C.J. ; Socha, R.J. ; Van Den Broeke, D.J. ; Schaefer, E. ; Cook, P.
Pub. info.: Optical Microlithography XVII.  pp.1032-1039,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
5.

Conference Proceedings
Conference Proceedings
5. The impact of MEEF through pitch for 120-nm contact holes
Litt, L.C. ; Wu, W. ; Conley, W. ; Lucas, K.D. ; Roman, B.J. ; Montgomery, P. ; Kasprowicz, B.S. ; Progler, C.J. ; Socha, R.J. ; Verhappen, A. ; Wampler, K.E. ; Schaefer, E. ; Cook, P. ; Kuijten, J.-P. ; Pijnenburg, W.
Pub. info.: Optical Microlithography XVII.  pp.1305-1314,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377