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29 results

Conference Proceedings

1. RAPID PLAN VIEW FABRICATION OF SEMICONDUCTOR TEM SAMPLES FOR INTERFACE STRAIN AND GRAIN SIZE ANALYSIS

Cole, M.W. ; Flemish, J.R.

Pub. info.:	Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A.. pp.233-238, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	254

Conference Proceedings

2. Correlation Of Microwave Dielectric Properties And Microstructure Of Unpatterned Ferro electric Thin Films

Geyer, R.G. ; Cole, M.W. ; Joshi, P.C. ; Ngo, E. ; Hubbard, C. ; Nothwang, W. ; Bratcher, M. ; Ervin, M. ; Wood, M.

Pub. info.:	Materials issues for tunable RF and microwave devices III : symposium held April 2-3, 2002, San Francisco, California, U.S.A.. pp.123-130, 2002. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	720

Conference Proceedings

3. Novel Dielectric Thin Films for Frequency Agile Microwave Devices

Cole, M.W. ; Nothwang, W. ; Hubbard, C. ; Ngo, E. ; Ervin, M. ; Geyer, R.G.

Pub. info.:	Dielectrics in emerging technologies : proceedings of the international symposium. pp.280-289, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-1

Conference Proceedings

4. Fabrication and Materials Characterization of Pulsed Laser Deposited Nickel Suicide Ohmic Contacts to 4H n-SiC

Cole, M.W. ; Joshi, P G. ; Hubbard, C.W. ; Ngo, E. ; Demaree, J.D. ; Hirvonen, I.K. ; Wood, M. ; Ervin, M. ; Richardson, C.J.K. ; Wisnioski, M.H.

Pub. info.:	High Speed Compound Semiconductor Devices for Wireless Applications and State-of-the-Art Program on Compound Semiconductors (XXXIII) : proceedings of the International Symposium. pp.198-209, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-18

Conference Proceedings

5. Thermal Stability of Ni-Based Ohmic Contacts to n-SiC for High Temperature And Pulsed Power Device Applications*

Cole, M.W. ; Joshi, P.C. ; Hubbard, C. ; Demaree., J.D. ; Ervin, M.

Pub. info.:	State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia. pp.172-177, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-3

Conference Proceedings

6. Formation and Thermal Stability of Ni/Wsi/Ti/Pt Composite Ohmic Contacts to n-SiC for High Power Device Applications

Cole, M.W. ; Joshi, P.C. ; Hubbard, C.W. ; Demaree, D.J. ; Wood, M.C. ; Ervin, M.H. ; Ren, F.

Pub. info.:	Compound semiconductor power transistors II : proceedings of the second international symposium and state-of-the-art program on compound semiconductors (SOTAPOCS XXXII) : proceedings of the thirty-second international symposium. pp.90-102, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-1

Conference Proceedings

7. Damping of polycrystalline Ni-Mn-Ga, bulk, PLD, and sputtered thin film

Ruggles, D.A. ; Gans, E. ; Mohanchandra, K.P. ; Carman, G.P. ; Ngo, E. ; Nothwang, W. ; Cole, M.W.

Pub. info.:	Smart structures and materials 2004 : active materials : behavior and mechanics : 15-18 March 2004, San Diego, California, USA. pp.156-163, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5387

Conference Proceedings

8. MICROSTRUCTURE ANALYSIS OF THERMALLY STABLE OHMIC CONTACT TO BOTH n AND p+ -GaAs

Han, W.Y. ; Lee, H.S. ; Lu, Y. ; Cole, M.W. ; Casas, L.M. ; DeAnni, A. ; Jones, K.A. ; Yang, L.W.

Pub. info.:	Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.709-714, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	281

Conference Proceedings

9. SURFACE AND INTERFACE DAMAGE CHARACTERIZATION OF REACTIVE ION ETCHED MBE REGROWN GaAs

Cole, M.W. ; Dutta, M. ; Rossabi, J. ; Smith, D.D. ; Lehman, J.L.

Pub. info.:	Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.987-992, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	163

10.

Conference Proceedings

10. Pd/Au:Be OHMIC CONTACTS TO p-TYPE GaAs

Schmitz, K.M. ; Jiao, K.L. ; Sharma, R. ; Anderson, W.A. ; Rajeswaran, G. ; Zheng, L.R. ; Cole, M.W. ; Lareau, R.T.

Pub. info.:	Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.993-996, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	163

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