Search records | 東京工業大学附属図書館文献データベース

Sort order

4 results

Conference Proceedings

1. Friction on an Atomic Scale

Colchero J. ; Marti O. ; Mlynek J.

Pub. info.:	Forces in scanning probe methods. pp.345-352, 1995. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	286

Conference Proceedings

2. Scanning Probe Microscopy Instrumentation

Marti O. ; Colchero J.

Pub. info.:	Forces in scanning probe methods. pp.15-34, 1995. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	286

Conference Proceedings

3. Modulation Technique for measuring Frictio on a Nanometer Scale

Colchero J. ; Luna M. ; Baro M. A.

Pub. info.:	Micro/nanotribology and its applications. pp.217-223, 1997. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	330

Conference Proceedings

4. Friction and Forces on an Atomic Scale

Marti O. ; Colchero J. ; Mlynek J.

Pub. info.:	Nanosources and manipulation of atoms under high fields and temperatures : applications. pp.253-269, 1993. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO ASI series. Series E, Applied sciences
Ser. no.:	235