Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.. pp.65-70, 1989. Pittsburgh, Pa.. Materials Research Society
Loxley, N. ; Cockerton, S. ; Cooke, L. M. ; Gray, T. ; Tanner, B. K. ; Bowen, D. K.
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Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.451-, 1994. Pittsburgh. MRS - Materials Research Society
Cockerton, S. ; Cooke, M. L. ; Bowen, D. K. ; Tanner, B. K.
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Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.555-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society