1.

Conference Proceedings
Conference Proceedings
1. EVIDENCE FOR COMPLEXES OF HYDROGEN WITH IMPURITIES OR DEFECTS IN BULK III-V MATERIALS
Clerjaud, B. ; Cote, D. ; Krause, M. ; Naud, C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.341-344,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. THE DONOR STATE OF VANADIUM IN INDIUM PHOSPHIDE
Bremond, G. ; Nouailhat, A. ; Guillot, G. ; Deveaud, B. ; Lambert, B. ; Toudic, Y. ; Clerjaud, B. ; Naud, C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.359-364,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Conference Proceedings
Conference Proceedings
3. Spectroscopic Investigation of Vanadium Acceptor Level in 4H and 6H-SiC
Lauer, V. ; Bremond, G. ; Souifi, A. ; Guillot, G. ; Chourou, K. ; Madar, R. ; Clerjaud, B.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.635-638,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)