1.

Conference Proceedings
Conference Proceedings
1. Fundamental Modeling of Transient-Enhanced Diffusion Through Extended Defect Evolution
Gencer, A. H. ; Chakravarthi, S. ; Clejan, I. ; Dunham, S. T.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.359-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
2.

Conference Proceedings
Conference Proceedings
2. Modeling Interactions of Point Defects with Precipitates Using the Reduced Precipitation Model
Clejan, I. ; Dunham, S.T.
Pub. info.: Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.398-406,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-4
3.

Conference Proceedings
Conference Proceedings
3. A Reduced Moment-Based Model for Precipitation Kinetics and Application to Dopant Activation in Silicon
Clejan, I. ; Dunham, S.T.
Pub. info.: ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology.  pp.21-31,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-5