1.

Conference Proceedings
Conference Proceedings
1. Measurement of electron effective mass ratios in Hg1-xCdxTe for 0.20 ≦ X ≦ 0.30 between 77K and 296K (Invited Paper)
Clarke, F. W. ; Balevieius, S. ; McDonald, J. K. ; Grisham, J. A.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.73-85,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564
2.

Conference Proceedings
Conference Proceedings
2. Growth and characterization of AIGaN/GaN epitaxial layers by MOCVD on SiC substrates for RF device applications (Invited Paper) [6121-13]
Sood, A. K. ; Singh, R. ; Puri, Y. R. ; Clarke, F. W. ; Laboutin, O. ; Deluca, P. M. ; Wesler, R. E. ; Deng, J. ; Hwang, J. C. M.
Pub. info.: Gallium Nitride Materials and Devices.  pp.61210D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6121