1.

Conference Proceedings
Conference Proceedings
1. Defect Formation and Macroscopic Modelling of Silicon Carbide Sublimation Process
Pons, M. ; Blanquet, E. ; Bernard, C. ; Dedulle, J.M. ; Anikin, M. ; Chourou, K. ; Madar, R.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.262-269,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
2.

Conference Proceedings
Conference Proceedings
2. Spectroscopic Investigation of Vanadium Acceptor Level in 4H and 6H-SiC
Lauer, V. ; Bremond, G. ; Souifi, A. ; Guillot, G. ; Chourou, K. ; Madar, R. ; Clerjaud, B.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.635-638,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)