1.
Conference Proceedings
Choi, Y.W. ; Wie, C.R. ; Vernon, S.M.
Pub. info.:
Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. . pp.789-794, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
160
2.
Conference Proceedings
Choi, Y.W. ; Wie, C.R. ; Evans, K.R. ; Stutz, C.E.
Pub. info.:
Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. . pp.795-800, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
160
3.
Technical Paper
Choi, Y.W. ; Jung, N.K. ; Choi, J.S. ; Moon, K.W.
Pub. info.:
2007 SAE world congress : technical paper . 2007. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:
Society of Automotive Engineers technical paper series
Ser. no.:
2007
4.
Conference Proceedings
Lee, E.-H. ; Lee, S.G. ; Park, B.H.O.S.G. ; Kim, K.H. ; Kang, J.K. ; Chin, I. ; Kwon, Y.K. ; Choi, Y.W.
Pub. info.:
Organic Photonic Materials and Devices VII . pp.112-123, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5724
5.
Conference Proceedings
Lee, E.-H. ; Lee, S.G. ; Park, B.H.O.S.-G. ; Kim, K.H. ; Kang, J.K. ; Choi, Y.W.
Pub. info.:
Optoelectronic Integrated Circuits VII . pp.118-129, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5729
6.
Conference Proceedings
Song, J.S. ; Lee, Y.W. ; Song, J.B. ; Lee, I.W. ; Yang, H.S. ; Choi, Y.W. ; Jo, J.H.
Pub. info.:
Interferometry XI: Applications . pp.227-236, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4778