1.

Conference Proceedings

Conference Proceedings
Choi, Y.W. ; Wie, C.R. ; Vernon, S.M.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.789-794,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
2.

Conference Proceedings

Conference Proceedings
Choi, Y.W. ; Wie, C.R. ; Evans, K.R. ; Stutz, C.E.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.795-800,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
3.

Technical Paper

Technical Paper
Choi, Y.W. ; Jung, N.K. ; Choi, J.S. ; Moon, K.W.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
4.

Conference Proceedings

Conference Proceedings
Lee, E.-H. ; Lee, S.G. ; Park, B.H.O.S.G. ; Kim, K.H. ; Kang, J.K. ; Chin, I. ; Kwon, Y.K. ; Choi, Y.W.
Pub. info.: Organic Photonic Materials and Devices VII.  pp.112-123,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5724
5.

Conference Proceedings

Conference Proceedings
Lee, E.-H. ; Lee, S.G. ; Park, B.H.O.S.-G. ; Kim, K.H. ; Kang, J.K. ; Choi, Y.W.
Pub. info.: Optoelectronic Integrated Circuits VII.  pp.118-129,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5729
6.

Conference Proceedings

Conference Proceedings
Song, J.S. ; Lee, Y.W. ; Song, J.B. ; Lee, I.W. ; Yang, H.S. ; Choi, Y.W. ; Jo, J.H.
Pub. info.: Interferometry XI: Applications.  pp.227-236,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4778