1.

Conference Proceedings
Conference Proceedings
1. KARI's Data Acquisition and Power Supply Control System (KADAPS) for Large Thermal Vacuum Chamber (KARI-TVC5)
Cho, H. ; Moon, G. W. ; Seo, H. J. ; Lee, S. H. ; Choi, S. W.
Pub. info.: Proceedings of the 6th International Symposium on Environmental Testing for Space Programmes : 12-14 June 2007, Noordwijk, The Netherlands.  2007.  Noordwijk, The Netherlands.  ESA Communication Production Office
Title of ser.: ESA SP
Ser. no.: 639
2.

Conference Proceedings
Conference Proceedings
2. Optimal Growth of InGaAs/InAlAs Distributed Bragg Reflectors Lattice-Matched on InP Substrates
Choi, S. W. ; Lee, J. H. ; Baek, J. H. ; Lee, E. H. ; Lee, B.
Pub. info.: Optoelectronic materials : ordering, composition modulation, and self-assembled structures : symposium held November 28-30, 1995, Boston, Massachusetts, U.S. ..  pp.331-,  1996.  Pittsburgh, Pennsylvania..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 417
3.

Conference Proceedings
Conference Proceedings
3. Deposition of Diamondlike Carbon Films and Structural, Optical, and Electron Emission Characteristics
Choi, S. W. ; Paek, M. C. ; Lee, J. H. ; Hong, S. U. ; Nam, K. S.
Pub. info.: Covalently bonded disordered thin-film materials : symposium held December 2-4, 1997, Boston, Massachusetts, U.S.A..  pp.159-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 498
4.

Conference Proceedings
Conference Proceedings
4. Rapid thermal annealing for electrical activation in the fabrication of GaAs MESFET
Choi, S. W. ; Yang, J. W. ; Koak, B. H. ; Cho, K. I. ; Park, H. M.
Pub. info.: III-V electronic and photonic device fabrication and performance : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.575-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 300
5.

Conference Proceedings
Conference Proceedings
5. EUV mask pattern inspection for memory mask fabrication in 45-nm node and below [6349-95]
Kim, D. Y. ; Cho, S. Y. ; Kim, H. ; Huh, S. M. ; Chung, D. H. ; Cha, B. C. ; Lee, J. W. ; Choi, S. W. ; Han, W. S. ; Park, K. H. ; Kim, E. J. ; Guo, Z. ; Quach, E. ; Gee, D. ; Brown, T.
Pub. info.: Photomask Technology 2006.  pp.63492L-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
6.

Conference Proceedings
Conference Proceedings
6. The detectability of Qz phase defects and its application for 65 nm node CPL mask manufacturing [5992-05]
Cho, W. I. ; Park, J. H. ; Chung, D. H. ; Choi, S. W. ; Han, W. S.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.599205-599205,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
7.

Conference Proceedings
Conference Proceedings
7. Implementation of reflected light die-to-die inspection and ReviewSmart to improve 65nm DRAM mask fabrication [5992-09]
Kim, D. Y. ; Cho, W. I. ; Park, J. H. ; Chung, D. H. ; Cha, B. C. ; Choi, S. W. ; Han, W. S. ; Park, K. H. ; Kim, N. W. ; Hess, C. ; Ma, W. ; Kim, D.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.599209-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
8.

Conference Proceedings
Conference Proceedings
8. Feasibility study of mask fabrication in double exposure technology [6349-67]
Doh, J. G. ; Lee, S. H. ; Yoon, J. B. ; Lee, D. Y. ; Cho, S. Y. ; Kim, B. G. ; Choi, S. W. ; Han, W. S.
Pub. info.: Photomask Technology 2006.  pp.63491U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349