1.

Conference Proceedings
Conference Proceedings
1. Novel buffer scheduling algorithm for burst control packet in optical burst switching WDM networks
Kim, J. ; Yun, H.H. ; Choi, J.S. ; Kang, M.H.
Pub. info.: APOC 2002: Asia-Pacific Optical and Wireless Communications : optical networking II : 16-18 October 2002, Shanghai, China.  pp.54-62,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4910
2.

Conference Proceedings
Conference Proceedings
2. Content-based transcoding for dynamic video transmission
Kim, T. ; Choi, J.S.
Pub. info.: Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA.  pp.1125-1132,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4671
3.

Technical Paper
Technical Paper
3. Development of Telematics Software Platform Using WIPI for Service-Based Applications.
Choi, Y.W. ; Jung, N.K. ; Choi, J.S. ; Moon, K.W.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
4.

Conference Proceedings
Conference Proceedings
4. Impact of mask defect in a high MEEF process
Jeong, C.-Y. ; Park, K.-Y. ; Choi, J.S. ; Lee, J.G. ; Lee, D.-H.
Pub. info.: Optical Microlithography XVI.  Part Two  pp.1067-1078,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
5.

Conference Proceedings
Conference Proceedings
5. The study of contact hole MEEF and defect printability
Jeong, C.-Y. ; Lim, Y.H. ; Kim, H.I. ; Park, J.L. ; Choi, J.S. ; Lee, J.G.
Pub. info.: Optical Microlithography XVII.  pp.930-938,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
6.

Conference Proceedings
Conference Proceedings
6. The evaluation of assist feature defect printability for sub-0.13-μm technology
Jeong, C.-Y. ; Kim, Y.K. ; Park, K.-Y. ; Choi, J.S. ; Lee, J.G.
Pub. info.: Optical Microlithography XVII.  pp.1255-1266,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
7.

Conference Proceedings
Conference Proceedings
7. Integration using inorganic BARC in a via-first dual-damascene process with low-k dielectric
Ahn, J.K. ; Choi, S.H. ; Kim, Y.K. ; Park, K.Y. ; Choi, J.S. ; Hong, E.S. ; Shin, K.S. ; Kim, S.B. ; Choi, K.K. ; Hwang, S.B. ; Lee, J.G.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.673-683,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376