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16 results

Conference Proceedings

1. Hand/eye calibration of a robot arm with a 3D visual sensor

Kim,M.Y. ; Cho,H.S. ; Kim,J.H.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.123-134, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

2. 6-DOF pose estimation of polyhedral objects based on analysis of geometric features in x-ray images

Kim,J.W. ; Roh,Y.J. ; Cho,H.S.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.23-34, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

3. Image reconstruction in x-ray tomography using a radial basis function (RBF) neural network

Roh,Y.J. ; Cho,H.S.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.35-46, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

4. Inspection system for microelectronics BGA package using wavelength scanning interferometry

Kang,C.M. ; Woo,H.G. ; Cho,H.S. ; Hahn,J.W. ; Lee,J.Y.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.74-85, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

5. Neural-network-based parts classification for SMT processes

Kim,B.M. ; Cho,H.S.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.268-279, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

6. Measurement of vibrational motions using a three-facet mirror

Park,W.S. ; Cho,H.S. ; Byun,Y.K.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.302-310, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

7. Statistical-learning-based object recognition algorithm for solder joint inspection

Koh,K.C. ; Choi,H.J. ; Kim,J.S. ; Cho,H.S.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.260-267, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

8. Development of PMP system for high-speed measurement of solder paste volume on printed circuit boards

Jeong,K.M. ; Kim,J.S. ; Koh,K.C. ; Cho,H.S.

Pub. info.:	Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.250-259, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4564

Conference Proceedings

9. In-process layer surface inspection of SLA products

Park,W.S. ; Kim,M.Y. ; Lee,H.G. ; Cho,H.S. ; Leu,M.C.

Pub. info.:	Intelligent systems in design and manufacturing. pp.70-78, 1998. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3517

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Conference Proceedings

10. Inspection of ball grid array(BGA)solder joints using x-ray cross-sectional images

Roh,Y.J. ; Ko,K.W. ; Cho,H.S. ; Kim,H.C. ; Joo,H.N. ; Kim,S.K.

Pub. info.:	Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts. pp.168-178, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3836

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