1.

Conference Proceedings
Conference Proceedings
1. Charge/Discharge Performances of Tin Oxides Thin Film Negative Electrodes
Cho, W.-I. ; Nam, S.-C. ; Yoon, Y.-S. ; Cho, B.-W. ; Chun, H.-S. ; Yun, K.-S.
Pub. info.: Lithium batteries : proceedings of the international symposium.  pp.203-209,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-25
2.

Conference Proceedings
Conference Proceedings
2. Charge/Discharge Characteristics of 5n02 Coated Graphite Negative Electrode
Kang, T.-H. ; Cho, B.-W. ; Cho, W.-I. ; Ju, J.-B. ; Yun, K.-S.
Pub. info.: Lithium batteries : proceedings of the international symposium.  pp.194-202,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-25
3.

Conference Proceedings
Conference Proceedings
3. Identification of defect source to control reticle defect density for CAR and dry etching in the photomask process
Cho, S.-Y. ; Ahn, W.-S. ; Cho, W.-I. ; Sung, M.-G. ; Kim, Y.-H. ; Choi, S.-W. ; Yoon, H.-S. ; Sohn, J.-M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.107-117,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
4.

Conference Proceedings
Conference Proceedings
4. PSM defect printability of extremely low-k1 sub-130-nm KrF lithography
Cho, W.-I. ; Yeo, G. ; Moon, S.-Y. ; Yoon, H.-S. ; Sohn, J.-M.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part Two  pp.1202-1208,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889
5.

Conference Proceedings
Conference Proceedings
5. Identification of defect source to control reticle defect density for CAR and dry etching in the photomask process
Cho, S.-Y. ; Ahn, W.-S. ; Cho, W.-I. ; Sung, M.-G. ; Moon, S.-Y. ; Choi, S.-W. ; Yoon, H.-S. ; Sohn, J.-M.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part Two  pp.964-971,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889
6.

Conference Proceedings
Conference Proceedings
6. Process monitoring system for instant defect detection and analysis in 65 nm node photomask fabrications [5853-34]
Cho, Y.-S. ; Park, J.-H. ; Cho, W.-I. ; Kim, Y.-H. ; Choi, S.-W. ; Han, W.-S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.533-538,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853