Seo, S.-W. ; Cho, S.-Y. ; Huang, S. ; Brown, A.S. ; Jokerst, N.M.
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Semiconductor photodetectors : 28-29 January 2004, San Jose, California, USA. pp.48-56, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Cho, S.-Y. ; Seo, S.-W. ; Jokerst, N.M. ; Brooke, M.A.
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Semiconductor photodetectors : 28-29 January 2004, San Jose, California, USA. pp.57-64, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jung. W.-Y. ; Kim, C.-D. ; Eom, J-.D. ; Cho, S.-Y. ; Jeon, S.-M. ; Kim, J.-H. ; Moon, J.-I. ; Lee, B.-S. ; Park, S.-K.
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Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA. pp.61561J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Seo, S.-W. ; Cho, S.-Y. ; Huang, S. ; Jokerst, N.M. ; Brown, A.S.
Pub. info.:
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.52-60, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Cho, S.-Y. ; Seo, S.-W. ; Jokerst, N.M. ; Brooke, M.A.
Pub. info.:
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.61-68, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photomask and Next-Generation Lithography Mask Technology X. pp.107-117, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
22nd Annual BACUS Symposium on Photomask Technology. Part Two pp.964-971, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering