1.

Conference Proceedings

Conference Proceedings
Cho, J.S. ; Joo, S.M. ; Cho, S.H. ; Yu, Y.H. ; Kim, I.H. ; Kim, H. ; Han, C.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.1026-1029,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
2.

Conference Proceedings

Conference Proceedings
Cho, S.H. ; Joo, S.M. ; Cho, J.S. ; Yu, Y.H. ; Ahn, J.W. ; Han, C. ; Kim, H.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.502-505,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
3.

Conference Proceedings

Conference Proceedings
Kim, J.D. ; Kim, S.K. ; Cho, J.S. ; Kim, J.
Pub. info.: Functional monitoring and drug-tissue interaction : 21-24 January 2002, San Jose, USA.  pp.38-46,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4623
4.

Conference Proceedings

Conference Proceedings
Cho, J.-H. ; Cho, J.S. ; Moon, J.T. ; Lee, J. ; Cho, Y.H. ; Rollett, A.D. ; Oh, K.H.
Pub. info.: Textures of materials : ICOTOM 13 : proceedings of the 13th International Conference on Textures of Materials, Seoul, Korea, August 26-30, 2002.  pp.499-504,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 408-412
5.

Conference Proceedings

Conference Proceedings
Cho, J.S. ; Baek, S.H. ; Nam, K.H. ; Cho, H.J. ; Courboin, D. ; Jeong, S.H. ; Lee, I.S. ; Shin, C. ; Kim, H.S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology IX.  pp.205-216,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4754