1.

Conference Proceedings
Conference Proceedings
1. Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
Cho, C.R. ; Noh, K.Y. ; Lee, D.H. ; Kim, Y.S. ; Ko, S.W. ; Kim, C.W. ; Kim, D.H. ; Son, C.B. ; Kim, S.J. ; Cho, D.H. ; Choi, J.J. ; Kim, D.J. ; Bae, K.M. ; Rozgonyi, G.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.201-208,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. Thermal Interaction of Core Debris With a Supporting Steel Structure Under Severe Accident Conditions
Cheung, F.B. ; Shiah, S.W. ; Cho, D.H. ; Baker, Jr., L.
Pub. info.: AIChE ANNUAL MEETING, CHICAGO, IL. -NOVEMBER 11-16, 1990.  1990.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1990
3.

Conference Proceedings
Conference Proceedings
3. Properties of Catalytic Filter for the Hot Gas Cleaning
Lee, J.S. ; Shin, K.H. ; Shin, M.C. ; Cho, D.H. ; Lee, H.S.
Pub. info.: Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003.  pp.1181-1184,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 449-452
4.

Conference Proceedings
Conference Proceedings
4. Electrical defect SEM review under the various electric circumstances on SAC layer
Lee, T.Y. ; Whan, N.-K. ; Lee, B.H. ; Chin, S.-B. ; Cho, D.H. ; Choi, J.I. ; Hur, S.S. ; Ko, K.H. ; Yeo, J.-H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.859-864,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
5.

Conference Proceedings
Conference Proceedings
5. Optical characterization of defects on patterned wafers: exploring light polarization
Lee, B.H. ; Chin, S.-B. ; Cho, D.H. ; Song, C.-L. ; Yeo, J.-H. ; Some, D. ; Reinhorn, S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.849-858,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375