1.

Conference Proceedings
Conference Proceedings
1. High-resolution AM LCD development for avionic applications
Lamberth, L.S. ; Laddu, R.R. ; Harris, D. ; Sarma, K.R. ; Li, W.-Y. ; Chien, C.C. ; Chu, C.Y. ; Lee, C.S. ; Kuo, C.L.
Pub. info.: Cockpit displays X : 22-25 April 2003, Oriando, Florida, USA.  pp.70-79,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5080
2.

Conference Proceedings
Conference Proceedings
2. In-line measurement characterization for multi-layers film stack of SiGe by advance spectroscopy ellipsometer
Chen, J.C. ; Srivatsa, A. ; Chien, C.C. ; Liu, T.E.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.203-211,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041