1.

Conference Proceedings

Conference Proceedings
Godlewski,M. ; Chen,W.M. ; Monemar,B.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1353-1358,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Son,N.T. ; Wagner,Mt. ; Sorman,E. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.599-602,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Huang,S.L. ; Zhao,T.C. ; Chen,W.M.
Pub. info.: Smart materials, structures, and integrated systems : 11-13 December 1997, Adelaide, Australia.  pp.347-352,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3241
4.

Conference Proceedings

Conference Proceedings
Li,X.M. ; Chen,W.M. ; Huang,Z.Q. ; Huang,S.L. ; Bennett,K.D.
Pub. info.: Smart structures and materials 1998 : Sensory phenomena and measurement instrumentation for smart structures and materials : 2-4 March 1998, San Diego, California.  pp.126-133,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3330
5.

Conference Proceedings

Conference Proceedings
Lindstrom,J.L. ; Svensson,B.G. ; Chen,W.M.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.333-338,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
6.

Conference Proceedings

Conference Proceedings
Frens,A.M. ; Schmidt,J. ; Chen,W.M. ; Monemar,B.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.357-362,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
7.

Conference Proceedings

Conference Proceedings
Li,X.M. ; Chen,W.M. ; Zhu,Y. ; Huang,S.L. ; Bennett,K.D.
Pub. info.: Smart structures and materials 2000 : Sensory phenomena and measurement instrumentation for smart structures and materials : 6-8 March 2000, Newport Beach, USA.  pp.172-179,  2000.  Bellingham.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3986
8.

Conference Proceedings

Conference Proceedings
Chen,W.M.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.44-49,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
9.

Conference Proceedings

Conference Proceedings
Sorman,E. ; Son,N.T. ; Chen,W.M. ; Hallin,C. ; Lindstrom,J.L. ; Janzen,E.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.685-690,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
10.

Conference Proceedings

Conference Proceedings
Monemar,B. ; Chen,W.M. ; Godlewski,M.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.769-774,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41