1.

Conference Proceedings

Conference Proceedings
Chen,C.J. ; Chang,Y.H. ; Chen,T.C. ; Li,S.H. ; Chen,Y.F. ; Lin,H.H.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.429-434,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
2.

Conference Proceedings

Conference Proceedings
Choi,K.K. ; Chen,C.J. ; Goldberg,A.C. ; Chang,W.H. ; Tsui,D.C.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.441-452,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
3.

Conference Proceedings

Conference Proceedings
Choi,K.K. ; Chen,C.J. ; Tsui,D.C.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.300-310,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
4.

Conference Proceedings

Conference Proceedings
Chen,C.J. ; Jeng,D.-Y. ; Raychaudhuri,S. ; Uematsu,S. ; Hasegawa,Y.
Pub. info.: Sol-gel optics IV : 30 July-1 August 1997, San Diego, California.  pp.199-209,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3136
5.

Conference Proceedings

Conference Proceedings
Lin,F.H.H. ; Huang,J.H. ; Chou,E.H.Y. ; Yang,C.R. ; Chou,B.C.S. ; Luo,R.K.S. ; Kuo,W.K. ; Chang,J.W. ; Lu,M.H. ; Huang,W.H. ; Chen,C.J.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.67-72,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511