1.

Conference Proceedings
Conference Proceedings
1. STUDY OF LAYER DISORDERING IN MeV Si IMPLANTED GaAs/A1GaAs SUPERLATTICES
Chen, Samuel ; Lee, -Tong S. ; Braunstein, G. ; Rajeswaran, G.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.463-470,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
2.

Conference Proceedings
Conference Proceedings
2. RELALTIONSHIP BETWEEN ELECTRICAL ACTIVATION AND RESIDUAL DEFECTS IN MeV Si IMPLANTED GaAs
Braunstein, G. ; Zheng, L. -R. ; Chen, Samuel ; Lee, -Tong S. ; Peterson, D. L. ; Ko, K. -Y. ; Rajeswaran, G.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.379-384,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
3.

Conference Proceedings
Conference Proceedings
3. DEFECT STRUCTURE OF MeV Si IMPLANTATION IN GaAs
Lee, S.-Tong ; Braunstein, G. ; Chen, Samuel
Pub. info.: Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.183-188,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 126
4.

Conference Proceedings
Conference Proceedings
4. TEM STUDY OF THE ANNEALING BEHAVIOR OF SECONDARY DEFECTS IN 1 MeV Si IMPLANTED GaAs
Chen, Samuel ; Braunstein, G. ; Lee, S.-Tong
Pub. info.: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.233-238,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 138
5.

Conference Proceedings
Conference Proceedings
5. INFLUENCE OF THE TEMPERATURE OF IMPLANTATION ON THE MORPHOLOGY OF DEFECTS IN MeV IMPLANTED GaAs
Braunstein,. G. ; Chen, Samuel ; Lee, -Tong S ; Rajeswaran, G.
Pub. info.: Ion beam processing of advanced electronic materials : symposium held April 25-27, 1989, San Diego, California, U.S.A..  pp.191-196,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 147
6.

Conference Proceedings
Conference Proceedings
6. CORRELATION BETWEEN DEFECT CHARACTERISTICS AND LAYER INTERMIXING IN Si IMPLANTED GaAs/A1GaAs SUPERLATTICES
Chen, Samuel ; Lee, -Tong S. ; Braunstein, G. ; Rajeswaran G. ; Fillinger, P.
Pub. info.: Ion beam processing of advanced electronic materials : symposium held April 25-27, 1989, San Diego, California, U.S.A..  pp.279-284,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 147
7.

Conference Proceedings
Conference Proceedings
7. ON THE DISTRIBUTION MECHANISM OF VOIDS IN Si-IMPLANTED GaAs
Chen, Samuel ; Lee, S.-Tong ; Braunstein, G. ; Ko, K.Y. ; Tan, T.Y.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.421-426,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
8.

Conference Proceedings
Conference Proceedings
8. CORRELATION OF VOID FORMATIN WITH THE REDUCTION OF CARRIER ACTIVATION AND ANOMALOUS DOPANT DIFFUSION IN Si-IMPLANTED GaAs
Ko, Kei-Yu ; Chen, Samuel ; Lee, S.-Tong ; Zheng, Longru ; Tan, T.Y.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.983-986,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
9.

Conference Proceedings
Conference Proceedings
9. UHV-MOCVD GROWTH AND IN SITU CHARACTERIZATION OF EPITAXIAL TiO2 FILMS
Chen, Samuel ; Gysling, H.J. ; Paz-Pujalt, G.R. ; Blanton, T.N. ; Castro, T. ; Chen, K.M. ; Fictorie, C. ; Gladfelter, W.L. ; Franciosi, A. ; Cohen, P.I. ; Evans, J.F.
Pub. info.: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.173-178,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 280