Chen, H. ; Bedell, S. W. ; Murphy, R. J. ; Mocuta, D. M. ; Turansky, A. R ; Domenicucci, A. G. ; Sadana, D. K. (IBM)
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SiGe: materials, processing, and devices : proceedings of the First international symposium. pp.569-580, 2004. Pennington, N.J.. Electrochemical Society
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.513-519, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nanotechnology in mesostructured materials : proceedings of the 3rd International Mesostructured Materials Symposium, Jeju, Korea, July 8-11, 2002. pp.347-350, 2003. Amsterdam. Elsevier
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.594-601, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ulyanov, S. S. ; Chen, H. ; Kharish, N. A. ; Lepilin, A. V. ; Lin, N. ; Luo, Q. ; Naumov, M. ; Liu, Q. ; Safonkina, E. V. ; Sedykh, A. V. ; Ulianova, O. ; Yang, W. ; Zhu, D.
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Complex dynamics and fluctuations in biomedical photonics II : 22 and 25 January 2005, San Jose, California, USA. pp.215-221, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.338-343, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Image processing : algorithms and systems IV : 17-18 January 2005, San Jose, California, USA. pp.322-330, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biometric technology for human identification II : 28-29 March, 2005, Orlando, Florida, USA. pp.292-298, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering