1.

Conference Proceedings
Conference Proceedings
1. In vivo wireless biodiagnosis system for long-term bioactivity monitoring network
Chen, C.-K. ; Wu, W.-J. ; Yu, S.-A. ; Huang, J.-G. ; Lin, Y.-H. ; Chen, Y.-F. ; Jin, M.-H. ; Wen, C.-M. ; Kao, C.-Y. ; Lin, S.-M. ; Lu, S.-S. ; Lin, C.-W. ; Yen, J.-Y. ; Jaw, F.-S. ; Chen, C.-A. ; Liao, F.-J. ; Chiu, N.-F. ; Chien, C.-N. ; Lee, C.-K.
Pub. info.: Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA.  pp.288-297,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5394
2.

Conference Proceedings
Conference Proceedings
2. Design and implementation of smart sensor nodes for wireless disaster monitoring systems
Chen, Y.-F. ; Wu, W.-J. ; Chen, C.-K. ; Wen, C.-M. ; Jin, M.-H. ; Gau, C.-Y. ; Chang, C.-C. ; Lee, C.-K.
Pub. info.: Smart structures and materials 2004 : sensors and smart structures technologies for civil, mechanical, and aerospace systems : 15-18 March 2004, San Diego, California, USA.  pp.798-805,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5391
3.

Conference Proceedings
Conference Proceedings
3. Liquid immersion lithography at 157 nm
Chen, C.-K. ; Gau, T.-S. ; Shiu, L.-H. ; Lin, B. J.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.435-446,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
4.

Conference Proceedings
Conference Proceedings
4. Hierarchical sensor network architecture for stationary smart node supervision
Jin, M.-H. ; Wu, W.-J. ; Chen, C.-K. ; Chen, Y.-F. ; Wen, C.-M. ; Kao, C.-Y. ; Yu, S.-A. ; Lin, Y.-H. ; Huang, J.-G. ; Rao, H. ; Hsu, C.-H. ; Lee, C.-K.
Pub. info.: Smart structures and materials 2004 : smart electronics, MEMS, BioMEMS, and nanotechnology : 15-18 March 2004, San Diego, California, USA.  pp.53-63,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5389
5.

Conference Proceedings
Conference Proceedings
5. Model-based OPC for 0.13-μm contacts using 248-nm Att PSM
Shin, J.-J. ; Wu, T.C. ; Chen, C.-K. ; Liu, R.-G. ; Ku, Y.C. ; Lin, B.J.
Pub. info.: Optical Microlithography XV.  Part Two  pp.1296-1307,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691
6.

Conference Proceedings
Conference Proceedings
6. Low-cost and highly manufacturable 10Gb/s mini-flat transmitter for ethernet applications
Lee, S.-G. ; Chen, C.-L. ; Chao, C.-L. ; Lee, C.-H. ; Chen, C.-K. ; Liao, L.-C. ; Hsu, C.-H. ; Cheng, F.-Y. ; Tsai, C.-H. ; Huang, M.-F. ; Wang, C.-H. ; Chu, M.-T.
Pub. info.: Semiconductor and Organic Optoelectronic Materials and Devices.  pp.259-267,  2000.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5624
7.

Conference Proceedings
Conference Proceedings
7. Study of line edge roughness using continuous wavelet transform for 65-nm node
Shiu, L.-H. ; Chen, C.-K. ; Gau, T.-S. ; Lin, B.-J.
Pub. info.: Optical Microlithography XVII.  pp.1983-1991,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
8.

Conference Proceedings
Conference Proceedings
8. General scaling law of optical lithography optical theory
Chen, C.-K. ; Gau, T.-S. ; Chen, L.-J. ; Lee, C.-C. ; Shin, J.-J. ; Yen, A. ; Lin, B.-J.
Pub. info.: Optical Microlithography XVII.  pp.1487-1498,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377
9.

Conference Proceedings
Conference Proceedings
9. Mask error tensor and causality of mask error enhancement for low-k1 imaging: theory and experiments
Chen, C.-K. ; Gau, T.-S. ; Shin, J.-J. ; Liu, R.-G. ; Yu. S.-S. ; Yen, A. ; Lin, B.J.
Pub. info.: Optical Microlithography XV.  Part One  pp.247-258,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691