1.

Conference Proceedings
Conference Proceedings
1. Hausdorif distance based PCB inspection system with defect classification [6000-08]
Chen, C.-J. ; Lai, S.-H. ; Lee, W.-H. ; Lin, C.-Y. ; Ku, T. ; Chen, C.-H. ; Chung, Y.-C.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.600008-600008,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Conference Proceedings
Conference Proceedings
2. Photoemission and Photoabsorption Study of YNi2-xCoxB2C Superconductors
Hsu, L.-S. ; Guo, G.Y. ; Chen, C.-J. ; Lan, M.-D. ; Lee, J.-F.
Pub. info.: Application of synchrotron radiation techniques to materials science VI : symposium held April 16-20, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 678
3.

Conference Proceedings
Conference Proceedings
3. Mechanism of the Thermal Decomposition of Methane
Chen, C.-J. ; Back, M. H. ; Back, R. A.
Pub. info.: Industrial and laboratory pyrolyses : symposiums sponsored by the Division of Industrial and Engineering Chemistry at the first Chemical Congress of the North American Continent, Mexico City, Mexico, Dec. 1-2, 1975, and by the Division of Petroleum Chemistry at the 169th meeting of the American Chemical Society, Philadelphia, Pa., April 7-8, 1975.  pp.1-,  1976.  Washington.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 32
4.

Conference Proceedings
Conference Proceedings
4. Strength of signal flow in circuit simulation and its application
Chen, C.-J. ; Tai, W.-P. ; Sun, J.-D.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France.  pp.374-384,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4755
5.

Technical Paper
Technical Paper
5. Integrate Structural Optimization into Upfront Carbon Canister Component Design Process.
Chen, C.-J. ; Lin, J. ; Le, C.
Pub. info.: 2005 SAE world congress : technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005
6.

Conference Proceedings
Conference Proceedings
6. Method for continuous end standard measurement utilizing laser interferometer
Cheng, K.-Y. ; Tang, C.-C. ; Chang, W.-C. ; Chen, C.-J. ; Wu, T.-F. ; Chou, J.-T.
Pub. info.: Interferometry XII: Applications.  pp.364-371,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5532
7.

Conference Proceedings
Conference Proceedings
7. Image stitching for three-pass whole breast ultrasound [6147-21]
Chang, R.-F. ; Chen, C.-J. ; Takada, E. ; Chou, Y.-H. ; Chen, D.-R.
Pub. info.: Medical Imaging 2006: Ultrasonic Imaging and Signal Processing.  pp.61470L-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6147
8.

Conference Proceedings
Conference Proceedings
8. Pitch calibration by reflective laser diffraction
Chen, C.-J. ; Pan, S.-P. ; Chang, L.-C. ; Peng, G.-S.
Pub. info.: Recent Developments in Traceable Dimensional Measurements II.  pp.156-164,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5190
9.

Conference Proceedings
Conference Proceedings
9. Global CD uniformity improvement using dose modulation and pattern correction of pattern density-dependent and position-dependent errors
Chen, C.-J. ; Lee, H.-C. ; Yeh, L.-C. ; Liu, K.-C. ; Lien, T.-C. ; Chuo, Y.-C. ; Hsieh, H.-C. ; Lin, B.J.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.28-37,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446
10.

Conference Proceedings
Conference Proceedings
10. Global CD uniformity improvement for CAR masks by adaptive post-exposure bake with CD measurement feedback
Berger, L. ; Saule, W. ; Dress, P. ; Gairing, T.M. ; Chen, C.-J. ; Lee, H.-C. ; Hsieh, H.-C.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.148-154,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446