An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge

An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge

Author(s):

Dechiaro F. L. ( Bell Communications Research, U. S. A. )
Brick-Podriguez D. C. ( South Central Bell, U. S. A. )
Chemelli G. R.
Krupsky W. J.

Publication title:

Semiconductor device reliability

Title of ser.:

NATO ASI series. Series E, Applied sciences

Ser. no.:

175

Pub. Year:

1990

Page(from):

379

Page(to):

411

Pages:

33

Pub. info.:

Dordrecht: Kluwer Academic Publishers

ISSN:

0168132X

ISBN:

9780792305361 [0792305361]

Language:

English

Call no.:

N11482/175

Type:

Conference Proceedings

Details

TDL ID:	ZA00020566
Series ID:	PA00000018
Conf. info. (Name):	NATO Advanced Research Workshop on Semiconductor Device Reliability
Conf. info. (Number):	1989
Conf. info. (Venue):	Heraklio, Crete, Greece
Conf. info. (Date):	1989.06.04-1989.06.09

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