1.

Conference Proceedings
Conference Proceedings
1. Enhanced amorphous silicon technology for 320×240 microbolometer arrays with a pitch of 35μm
Mottin,E. ; Martin,J.-L. ; Ouvrier-Buffet,J.-L. ; Vilain,M. ; Bain,A. ; Yon,J.-J. ; Tissot,J.L. ; Chatard,J.P.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.250-256,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings
Conference Proceedings
2. LW MCT IRFPA cost optimization
Chatard,J.P.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.407-419,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
3.

Conference Proceedings
Conference Proceedings
3. 320｡ﾟ240 microbolometer uncooled IRFPA
Mottin,E. ; Martin,J.-L. ; Ouvrier-Buffet,J.-L. ; Vilain,M. ; Yon,J.-J. ; Chatard,J.P.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.40-46,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
4.

Conference Proceedings
Conference Proceedings
4. Detector Dewar cooler assemblies trade-off with equipment needs:a key issue for cost reduction
Chatard,J.P.
Pub. info.: Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida.  pp.235-245,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2746
5.

Conference Proceedings
Conference Proceedings
5. High-performance infrared detectors at SOFRADIR
Tribolet,P. ; Chorier,P. ; Manissadjian,A. ; Costa,P. ; Chatard,J.P.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.438-456,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028