Tissot, J.-L. ; Chatard, J.-P. ; Tinnes, S. ; Fieque, B.
Pub. info.:
Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.396-401, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tissot, J.-L. ; Astier, A. ; Chatard, J.-P. ; Tinnes, S. ; Trouilleau, C. ; Yon, J.-J.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.511-517, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tissot, J.-L ; Chatard, J.-P. ; Fieque, B. ; Legras, O.
Pub. info.:
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.94-99, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Trouilleau, C. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Yon, J.-J. ; Astier, A.
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Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.129-135, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fieque, B. ; Crastes, A. ; Tissot, J.-L. ; Chatard, J.-P. ; Tinnes, S.
Pub. info.:
Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.114-120, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering