1.

Conference Proceedings

Conference Proceedings
Lee,S.H. ; Kim,J. ; Choi,H. ; Chang,K.-H.
Pub. info.: Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA.  pp.428-434,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3164
2.

Conference Proceedings

Conference Proceedings
Kim,J.-H. ; Kim,J. ; Cho,S. ; Chang,K.-H.
Pub. info.: Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA.  pp.435-442,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3164
3.

Conference Proceedings

Conference Proceedings
Chang,K.-H. ; Huang,Y.-C. ; Lin,T.-H. ; Chang,C.-R.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.276-283,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635
4.

Conference Proceedings

Conference Proceedings
Chu,P.-T. ; Chang,K.-H. ; Peng,T.-M. ; Chang,C.-H. ; Yen,S.-W. ; Lin,T.-H. ; Chang,C.-R.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.66-76,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635
5.

Conference Proceedings

Conference Proceedings
Chien,C.-F. ; Chang,K.-H. ; Chen,C.-P.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.245-256,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344