Imaging spectrometry VIII : 8-10 July 2002, Seattle, Washington, USA. pp.426-436, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.599506-599506, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA. pp.406-415, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery IX : 21-24 April 2003, Orlando, Florida, USA. pp.765-776, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Chang, Y.-L. ; Takeuchi, T. ; Leary, M. ; Mars, D. ; Tandon, A. ; Twist, R. ; Belov, S. ; Boor, D. ; Tan, M. ; Roh, D. ; Song, Y.-K. ; Mantese, L. ; Luan, A.
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State-of-the-art program on compound semiconductors XXXIX and nitride and wide bandgap semiconductors for sensors, photonics, and electronics IV : proceedings of the international symposia. pp.33-44, 2003. Pennington, N.J.. Electrochemical Society