1.

Conference Proceedings

Conference Proceedings
Foshee, J.J. ; Tahim, R.S. ; Chang, K.
Pub. info.: Digital wireless communications IV : 1-2 April 2002, Orlando, USA.  pp.207-218,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4740
2.

Conference Proceedings

Conference Proceedings
Lu, C.J. ; Bendersky, L.A. ; Chang, K. ; Takeuchi, I.
Pub. info.: Structure-property relationships of Oxide surfaces and interfaces II : symposium held December 2-3, 2002, Boston, Massachusetts, U.S.A..  pp.37-42,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 751
3.

Conference Proceedings

Conference Proceedings
Grebs, T. ; Ridley, R. ; Chang, K. ; Wu, C.-T. ; Agarwal, R. ; Mytych, J. ; Dimachkie, W. ; Dolny, G. ; Michalowicz, J. ; Ruzyllo, J.
Pub. info.: Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium.  pp.108-115,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-26
4.

Conference Proceedings

Conference Proceedings
Chang, K. ; Shanmugasundaram, K. ; Lee, D.-O. ; Roman, P. ; Shallenberger, J. ; Chang, F.-M. ; Wang, J. ; Beck, R. ; Mumbauer, P. ; Grant, R. ; Ruzyllo, J.
Pub. info.: Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium.  pp.78-85,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-26
5.

Conference Proceedings

Conference Proceedings
Tahim, R.S. ; Foshee, J.J. ; Chang, K.
Pub. info.: Sensors, and command, control, communications, and intelligence (C31) technologies for homeland defense and law enforcement II : 21-25 April 2003, Orlando, Florida, USA.  pp.421-432,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5071
6.

Conference Proceedings

Conference Proceedings
Chang, K. ; Shallenberger, J. ; Chang, F.-M. ; Shanmugasundaram, K. ; Roman, P. ; Mumbauer, P. ; Ruzyllo, J.
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.404-410,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-05
7.

Conference Proceedings

Conference Proceedings
Shanmugasundaram, K. ; Chang, K. ; Shallenberger, J. ; Danel, A. ; Tardif, F. ; Ruzyllo, J.
Pub. info.: Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium.  pp.348-355,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-26
8.

Conference Proceedings

Conference Proceedings
Chang, K. ; Bowyer, K.W. ; Flynn, P.J. ; Chen, X.
Pub. info.: Biometric technology for human identification.  pp.1-11,  2004.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5404
9.

Conference Proceedings

Conference Proceedings
Tahim, R.S. ; Foshee, J. ; Chang, K.
Pub. info.: Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense III.  pp.661-672,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5403
10.

Conference Proceedings

Conference Proceedings
Papavasiliou, A. ; Olivier, S. ; Barbee, T. ; Miles, R ; Chang, K.
Pub. info.: MEMS/MOEMS Components and Their Applications III.  pp.61130Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6113