1.

Conference Proceedings
Conference Proceedings
1. A Hierarchical Self-Organizing Neural Network for Automatic Wafer Defect Inspection
Chang, C.Y. ; Chang, C.W.
Pub. info.: Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005.  pp.1147-1152,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 505-507
2.

Conference Proceedings
Conference Proceedings
2. Dynamic Model Based on Genetic Algorithms of Prediction for the Thermal Deformation of Machine Tools
Chang, C.W. ; Chu, M.H. ; Chen, Y.W. ; Chien, S.Y. ; Kang, Y.
Pub. info.: Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005.  pp.163-168,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 505-507
3.

Conference Proceedings
Conference Proceedings
3. Molecular contamination effects on the thermal emittance of highly reflective surfaces at cryogenic temperrtures
Chang, C.W.
Pub. info.: Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA.  pp.119-128,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4774
4.

Conference Proceedings
Conference Proceedings
4. Multi-Via Electromigration Test Structures for Identification and Characterization of Different Failure Mechanisms
Choi, Z.-S. ; Chang, C.W. ; Lee, J.H. ; Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K.
Pub. info.: Materials, technology and reliability of advanced interconnects - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.271-276,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 863
5.

Conference Proceedings
Conference Proceedings
5. Mortality Dependence of Cu Dual Damascene Interconnects on Adjacent Segment
Chang, C.W. ; Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K. ; Hwang, N.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.339-344,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 812
6.

Conference Proceedings
Conference Proceedings
6. Optical studies of InAs/GaAs and Ge/Si quantum dot structures (Invited Paper)
Jan, G.-J. ; Lai, C.M. ; Chang, F.Y. ; Perng, Y.H. ; Chang, C.W. ; Kao, C.H. ; Jan, I.C. ; Lin, H.H.
Pub. info.: Quantum Sensing: Evolution and Revolution from Past to Future.  pp.249-260,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4999