1.

Conference Proceedings
Conference Proceedings
1. Characterization of Structural Quality of Bonded Silicon-on-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy
Nguyen, N.V. ; Maslar, J.E. ; Kim, Jin-Yong ; Han, Jin-Ping ; Park, Jin-Won ; Chandler-Horowitz, D. ; Vogel, E.M.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.127-132,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
2.

Conference Proceedings
Conference Proceedings
2. ANALYSIS FOR THE CHARACTERIZATION OF OXYGEN IMPLANTED SILICON (SIMOX) BY SPECTROSCOPIC ELLIPSOMETRY
Doss, M.G. ; Chandler-Horowitz, D. ; Marchiando, J.F. ; Krause, S. ; Seraphin, S.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.493-498,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
3.

Conference Proceedings
Conference Proceedings
3. INTERFACE ROUGHNESS-INDUCED CHANGES IN THE NEAR-E0 SPECTROSCOPIC BEHAVIOR OF SHORT-PERIOD AlAs/GaAs SUPERLATTICES
Chandler-Horowitz, D. ; Pellegrino, J. G. ; Nguyen, N. V. ; Amirtharaj, P. M. ; Qadri, S. B.
Pub. info.: Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A..  pp.145-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 326
4.

Conference Proceedings
Conference Proceedings
4. Double Modulation and Selective Excitation Photoreflectance for Characterizing Highly Luminescent Semiconductor Structures and Samples with Poor Surface Morphology
Amirtharaj, P. M. ; Chandler-Horowitz, D. ; Bour, D. P.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.229-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
5.

Conference Proceedings
Conference Proceedings
5. CHARACTERIZATION OF THE ZnSe/GaAs INTERFACE LAYER BY TEM AND SPECTROSCOPIC ELLIPSOMETRY
Dahmani, R. ; Salamanca-Riba, L. ; Beesabathina, D.P. ; Nguyen, N.V. ; Chandler-Horowitz, D. ; Jonker, B.T.
Pub. info.: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.271-274,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 280