1.

Conference Proceedings
Conference Proceedings
1. Investigatiou of Stacking Faults in Silicon by Induced Current Methods
Castaldini,A. ; Cavallini,A. ; Poggi,A. ; Susi,E.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1295-1300,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings
Conference Proceedings
2. Spatial Distribution of Vacancy Defects in GaAs:Te Wafers Studied by Positron Annihilation
Cavallini,A. ; Dupasquier,A. ; Ferro,G. ; Piqueras,J. ; Valli,M.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.614-616,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257