Ballet, P ; Castelein, P. ; Baylet, J. ; Laffosse, E. ; Fendler, M. ; Pottier, F. ; Gout, S. ; Vergrnaud, C. ; Ballerand, S. ; Gravrand, O. ; Deplanche, J. C. ; Martin, S. ; Zanatta, J. P. ; Charmonal, J. P. ; Million, A.
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Infrared photoelectronics : 30-31 August 2005, Warsaw, Poland. pp.595703-595703, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Baylet, J.P. ; Zanatta, J.-P. ; Chance, D. ; Gravrand, O. ; Rothan, f. ; De Borniol, E. ; Castelein, P. ; Chamonal, J.-P. ; Revetto, M. ; Destefanis, G.L.
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Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA. pp.128-137, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mottin, E. ; Bain, A. ; Castelein, P. ; Ouvrier-Buffet, J.-L. ; Tissot, J.-L. ; Yon, J.-J.
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Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA. pp.138-149, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Perrais, G. ; Rothman, J. ; Destefanis, G. ; Baylet, J. ; Castelein, P. ; Charmonal, J. -P. ; Tribolet, P.
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Electro-optical and infrared systems : technology and applications III : 13-14 September 2006, Stockholm, Sweden. pp.63950H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Durand, A. ; de Borniol, E. ; Guerineau, N. ; Cathala, T. ; Yon, J.-J. ; Ouvrier-Buffet, J.-L. ; Castelein, P. ; Tronel, R. ; Bisotto, S. ; Destefanis, G.L. ; Chamonal, J.-P.
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Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.189-200, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Badano, G. ; Baliet, P. ; Zanatta, J. P. ; Millon, A. ; Largeron, C. ; Baylet, J. ; Rothman, J. ; Gravrand, O. ; Castelein, P. ; Chamonal, J. P. ; Destefanis, G.
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Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.596406-596406, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Baylet, J. ; Zanatta, J.-P. ; Chance, D. ; Gravrand, O. ; Rothan, F. ; De Borniol, E. ; Castelein, P. ; Chamonal, J.-P. ; Ravetto, M. ; Destefanis, G.L.
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Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA. pp.134-143, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Castelein, P. ; Marion, F. ; Martin, J.-L. ; Baylet, J.P. ; Moussy, N. ; Gravrand, O. ; Durand, A. ; Chamonal, J.-P. ; Destefanis, G.L.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.52-59, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Castelein, P. ; Rambaud, P. ; Chamonal, J.-P. ; Laflaquiere, A. ; Perez, A. ; Ravetto, M. ; Destefanis, G.L. ; Caes, M.
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Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA. pp.252-259, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Durand, A. ; de Borniol, E. ; Vinciguerra, R. ; Cathala, T. ; Yon, J. J. ; Castelein, P. ; Tronel, R. ; Destefanis, G. L.
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Electro-optical and infrared systems : technology and applications : 25-27 October 2004, London, United Kingdom. pp.304-314, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering