Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.234-249, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.241-246, 1994. Zurich, Switzerland. Trans Tech Publications
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1425-1428, 1998. Zuerich, Switzerland. Trans Tech Publications
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.200-210, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering