1.

Conference Proceedings

Conference Proceedings
Omnes,F. ; Monroy,E. ; Beaumont,B. ; Calle,F. ; Munoz,E. ; Gibart,P.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.234-249,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
2.

Conference Proceedings

Conference Proceedings
Alvarez,A.L. ; Wagner,J. ; Calle,F. ; Maier,M. ; Gutierrez,G. ; Sacedon,A. ; Calleja,E. ; Mufioz,E.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.241-246,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Beaumont,B. ; Calle,F. ; Haffouz,S. ; Monroy,E. ; Leroux,M. ; Calleja,E. ; Lorenzini,P. ; Mufioz,E. ; Gibart,P.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1425-1428,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings

Conference Proceedings
Munoz,E. ; Monroy,E. ; Calle,F. ; Sanchez,M.A. ; Calleja,E. ; Omnes,F. ; Gibart,P. ; Jaque,F. ; Carcer,I.Aguirre de
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.200-210,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629