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Conference Proceedings

1. Effect of Substrate Surface Conditions on Electrochemical Performance of Si Thin Film Anode

H. Deng ; M. Park ; C. Chung ; C. Park ; S. Joo

Pub. info.:	Electrode Materials and Processes for Energy Conversion and Storage. pp.105-112, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(8)

Conference Proceedings

2. Influence of Heat Input on Mechanical Properties of Multipass Low-Alloy Steel Weld Metal

K.S. Bang ; C. Park ; W.S. Chang ; C.G. Park ; W.H. Chung

Pub. info.:	Advanced welding and micro joining/packaging for the 21st century : selected peer reviewed papers from the International Welding/Joining Conference, Korea 2007 (IWJC, Korea 2007), which was held from 10th-12th May 2007 at COEX, Seoul, Korea. pp.17-20, 2008. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	580-582

Conference Proceedings

3. Hydrogen Production by Steam Dissociation using Oxygen Transport Membranes

T. Lee ; C. Park ; S.E. Dorris ; U. Balachandran

Pub. info.:	Ionic and Mixed Conducting Ceramics 6. pp.379-384, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(26)

Conference Proceedings

4. La_0.7Sr_0.3Cu_0.2Fe_0.8O_3-δ as Oxygen Transport Membrane for Producing Hydrogen via Water Splitting

C. Park ; T. Lee ; S.E. Dorris ; U. Balachandran

Pub. info.:	Ionic and Mixed Conducting Ceramics 6. pp.393-403, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(26)

Conference Proceedings

5. Removal of Backside Particles by a Single Wafer Megasonic System

H. Sohn ; U. Hong ; C. Park ; E. Lee ; H. Lee

Pub. info.:	Cleaning and surface conditioning technology in semiconductor device manufacturing 10. pp.95-100, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(2)

Conference Proceedings

6. Integration Challenges and Opportunities for Nanometer Scale CMOSFET with Metal/High-k Gate Stack

S. Song ; M. Hussain ; J. Barnett ; C.S. Park ; C. Park

Pub. info.:	ULSI process integration 5. pp.315-329, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(6)

Conference Proceedings

7. Charge Trapping Effects in High-k Transistors

C. Bersuker ; J. Sim ; C. Young ; R. Choi ; C. Park ; B. Lee

Pub. info.:	Physics and technology of high-k gate dielectrics III. pp.663-670, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(5)

Conference Proceedings

8. Charge Capture Kinetics of Nitride Trap in Oxide-Nitride-Oxide Structures

H. Cho ; C. Park ; H. Oh ; D. Kwak ; Y. Lee ; W. Yang ; C. Kim

Pub. info.:	Physics and technology of high-k gate dielectrics III. pp.671-680, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(5)

Conference Proceedings

9. Combination of magnetic resonance imaging and diffuse optical spectroscopy to predict radiation response in the breast: an exploratory pilot study

Progress in biomedical optics and imaging. vol.8, no.8

Pub. info.:	Multimodal biomedical imaging II : 20 and 23 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6431

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Conference Proceedings

10. Effects of Nitrogen on Weld Metal Microstructure and Toughness in Submerged Arc Welding

K.S. Bang ; W.Y. Kim ; C. Park ; Y.H. Ahn ; J.B. Lee

Pub. info.:	THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canada. 539-543 pp.3906-3911, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	539-543(4)

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