1.

Conference Proceedings
Conference Proceedings
1. Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Szilagyi,E. ; Hajnal,Z. ; Paszti,F. ; Buiu,O. ; Craciun,G. ; Cobianu,C. ; Savaniu,C. ; Vazsonyi,E.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.373-376,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
2.

Conference Proceedings
Conference Proceedings
2. Charge Carrier Lifetime Modification in Silicon by High Energy H+,He+ Ion Implantation
Khanh,N.Q. ; Tutto,P. ; Jaroli,E.N. ; Buiu,O. ; Biro,L.P. ; Paszti,F. ; Mohacsy,T. ; Kovacsics,C. ; Manuaba,A. ; Gyulai,J.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.101-106,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249