1.

Conference Proceedings
Conference Proceedings
1. Sample preparation impact on metal contamination evaluated by surface photovoltage and photoconductance decay
Buczkowski, A. ; Kirscht, F.G. ; Koya, H.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.376-384,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. DEEP LEVEL ENERGY ANALYSIS OF SURFACE AND BULK DEFECTS USING A NONCONTACT LASER/MICROWAVE PHOTOCONDUCTANCE TECHNIQUE
Buczkowski, A. ; Rozgonyi, G. A. ; Shimura, F.
Pub. info.: Photo-induced space charge effects in semiconductors: electro-optics, photoconductivity, and the photorefractive effect : symposium held April 29-May 1, 1992, San Francisco, California, U.S.A..  pp.235-240,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 261
3.

Conference Proceedings
Conference Proceedings
3. Epitaxial Layer Lifetime Characterization in the Frequency Domain
Park, J.E. ; Schroder, D.K. ; Tan, SE. ; Choi, B.D. ; Fletcher, M. ; Buczkowski, A. ; Kirscht, F.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.383-395,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
4.

Conference Proceedings
Conference Proceedings
4. SURFACE RECOMBINATION VELOCITY AND RECOMBINATION LIFETIME IN IRON CONTAMINATED SILICON
Buczkowski, A. ; Shimura, F. ; Rozgonyi, G.A.
Pub. info.: Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.495-504,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-7
5.

Conference Proceedings
Conference Proceedings
5. A STUDY OF SURFACE AND SUBSURFACE PROPERTIES OF Si(100) AFTER HYDROGEN ION-BEAM EXPOSURE
Liu, H. X. ; Schneider, T. P. ; Montgomery, J. ; Chen, Y. L. ; Buczkowski, A. ; Shimura, F. ; Nemanich, R. J. ; Maher, D. M. ; Korzec, D. ; Engemann, J.
Pub. info.: Surface chemical cleaning and passivation for semiconductor processing.  pp.231-,  1993.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 315
6.

Conference Proceedings
Conference Proceedings
6. Application Of Room-Temperature Photoluminescence For Characterizing As-Grown And Thermally Processed CZ Silicon Wafers
Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.173-178,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
7.

Conference Proceedings
Conference Proceedings
7. Temperature Dependence of Effective Lifetime for N-Type Silicon Wafers: Metastable Surface Recombination Centers
Daio, H. ; Buczkowski, A. ; Shimura, F.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.265-274,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1
8.

Conference Proceedings
Conference Proceedings
8. EBIC and SEM Studies of Enhanced DIffusion of Arsenic along Misfit Dislocations in Epltaxial Si/Si(Ge)
Braga, N. ; Buczkowski, A. ; Rozgonyi, G.A.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.157-166,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1
9.

Conference Proceedings
Conference Proceedings
9. Non-Contact Full Wafer Evaluation of Deep Levels in Silicon Via Temperature Dependent Surface Recombination Velocity, and Carrier Lifetime
Buczkowski, A. ; Rozgonyi, G.A. ; Shimura, F.
Pub. info.: Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II.  pp.1-14,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-3
10.

Conference Proceedings
Conference Proceedings
10. Photoluminescence Intensity Analysis in Application To Contactless Characterization of Silicon Wafers*
Buczkowski, A. ; Orsehel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Kirscht, F.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.299-310,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20