Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties

Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties

Author(s):

Sullivan, J.P.

Publication title:

Oxide Films : proceedings of the International Symposium

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

2000-4

Pub. Year:

2000

Page(from):

24

Page(to):

35

Pages:

12

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566772693 [1566772699]

Language:

English

Call no.:

E23400/2000-4

Type:

Conference Proceedings

Details

TDL ID:	ZA00013973
Series ID:	PA00000028
Conf. info. (Name):	Symposium on Oxide Films ; Meeting of the Electrochemical Society
Conf. info. (Number):	2000 ; 197th
Conf. info. (Venue):	Toronto, ON, Canada
Conf. info. (Date):	2000.05.15-2000.05.18

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