1.

Conference Proceedings
Conference Proceedings
1. HERMES: an imaging x-ray fluorescence spectrometer for the BepiColombo mission to Mercury
Owens,A. ; Bavdaz,M. ; Beijersbergen,M.W. ; Brunton,A.N. ; Fraser,G.W. ; Martin,D. ; Nieminen,P. ; Peacock,A.J. ; Pia,M.G.
Pub. info.: Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA.  pp.136-145,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4506
2.

Conference Proceedings
Conference Proceedings
2. LOBSTER-ISS: an imaging x-ray all-sky monitor for the International Space Station
Fraser,G.W. ; Brunton,A.N. ; Bannister,N.P. ; Pearson,J.F. ; Ward,M.J. ; Stevenson,T.J. ; Watson,D.J. ; Warwick,B. ; Whitehead,S. ; O'Brien,P.T. ; White,N. ; Jahoda,K. ; Black,K. ; Hunter,S.D. ; Deines-Jones,P. ; Priedhorsky,W.C. ; Brumby,S.P. ; Borozdin,K.N. ; Vestrand,T. ; Fabian,A.C.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA.  pp.115-126,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4497
3.

Conference Proceedings
Conference Proceedings
3. In-flight performance and calibration of the Chandra high-resolution camera imager(HRC-I)
Kenter,A.T. ; Chappell,J.H. ; Kraft,R.P. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Hole,K.T. ; Juda,M. ; Donnelly,R.H. ; Patnaude,D. ; Pease,D.O. ; Wilton,C. ; Zhao,P. ; Austin,G.K. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N. ; Barbera,M. ; Collura,A.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.467-492,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
4.

Conference Proceedings
Conference Proceedings
4. In-flight performance and calibration of the Chandra high-resolution camera spectroscopic readout(HRC-S)
Kraft,R.P. ; Chappell,J.H. ; Kenter,A.T. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Donnelly,R.H. ; Drake,J.J. ; Johnson,C.O. ; Juda,M. ; Patnaude,D. ; Pease,D.O. ; Ratzlaff,P.W. ; Wargelin,B.J. ; Austin,G.K. ; Fraser,G.W. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.493-517,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings
Conference Proceedings
5. MCP-based x-ray collimators for lithography of semiconductor devices
Brunton,A.N. ; Lees,J.E. ; Fraser,G.W. ; Tremsin,A.S. ; Feller,W.B. ; White,P.L.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.212-221,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
6.

Conference Proceedings
Conference Proceedings
6. Novel micropore x-ray optics produced with microchannel plate technology
Beijersbergen,M.W. ; Bavdaz,M. ; Peacock,A.J. ; Tomaselli,E. ; Fraser,G.W. ; Brunton,A.N. ; Price,G.J. ; Krumrey,M.K. ; Herrmann,C. ; Freund,A.K. ; Ziegler,E. ; Souvorov,A. ; Fairbend,R. ; Boutot,J.-P.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.218-224,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
7.

Conference Proceedings
Conference Proceedings
7. High-resolution micropore x-ray optics produced with microchannel plate technology
Beijersbergen,M.W. ; Bavdaz,M. ; Peacock,A.J. ; Tomaselli,E. ; Fairbend,R. ; Boutot,J.-P. ; Flyckt,S.O. ; Brunton,A.N. ; Price,G.J. ; Fraser,G.W. ; Herrmann,C. ; Krumrey,M.K. ; Ziegler,E. ; Freund,A.K.
Pub. info.: Advances in X-ray optics : 2-4 August 2000, San Diego, USA.  pp.188-192,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4145
8.

Conference Proceedings
Conference Proceedings
8. Characteristics of Photonis 6-μm pore microchannel Plates
Pearson,J.F. ; Brunton,A.N. ; Martin,A.P. ; Fraser,G.W. ; Lees,J.E. ; Boutot,J.P. ; Fairbend,R. ; Flyckt,S.O.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.217-228,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
9.

Conference Proceedings
Conference Proceedings
9. Recent Development of MCP Collimators for X-Ray Lithography of Semiconductor Devices,
Brunton,A.N. ; Fraser,G.W. ; Feller,W.B. ; White,P.L. ; Allott,R.M. ; Turcu,I.C.E. ; Kim,N.S. ; Lisi,N.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.1197-1198,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
10.

Conference Proceedings
Conference Proceedings
10. Absolute quantum efficiency calibration of the AXAF High-Resolution Camera
Kraft,R.P. ; Chappell,J.H. ; Kenter,A.T. ; Kobayashi,K. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Fraser,G.W. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N. ; Pearce,S.E.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.194-209,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808