Electrically based microstructural characterization III : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.269-276, 2002. Warrendale, PA. Materials Research Society
Brunkov, P.N. ; Patane, A. ; Levin, A. ; Eaves, L. ; Main, P.C. ; Musikhin, Yu.G. ; Volovik, B.V. ; Zhukov, A.E. ; Ustinov, V.M. ; Konnikov, S.G.
Pub. info.:
10th International Symposium on Nanostructures: Physics and Technology. pp.243-246, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering