Gajer, T. ; Kangaslahti, P. ; Tanner, A. ; Lambrigtsen, B. ; Brown, S. ; Dawson, D. ; Weinreb, S. ; Wilson, W.J. ; Lim, B. ; Ruf, C. ; Piepmeier, J.
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Microwave remote sensing of the atmosphere and environment V : 15-16 November 2006, Goa, India. pp.64100G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
MacWilliams, K. P. ; Lowry, L. E. ; Lin, S. T. ; Song, M. ; Cole, R. ; Brown, S.
Pub. info.:
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.. pp.259-264, 1991. Pittsburgh, Pa.. Materials Research Society
MacWilliams,. K. P. ; Yamada, W. E. ; Brown, S. ; Yabikum G. K. ; Lowry, L. ; Isaac, M.
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Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.. pp.125-130, 1992. Pittsburgh, PA. Materials Research Society
Ramseyer, G. O. ; Walsh, L. H. ; Beasock, J. V. ; Helbig, H. F. ; Lacoe, R. C. ; Brown, S.
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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.219-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Sharpe, W. N., Jr. ; Brown, S. ; Johnson, G. C. ; Knauss, W.
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Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A.. pp.57-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Barcomb, K. ; Schott, J. ; Brown, S. ; Hattenberger, T.
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Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA. pp.300-311, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Shrotriya, P. ; Allameh, S. ; Butterwick, A. ; Brown, S. ; Soboyejo, W.O.
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Materials science of microelectromechanical systems (MEMS) devices IV : symposium held November 25-28, 2001, Boston, Massachusetts, U.S.A.. pp.29-34, 2002. Warrendale, Pa.. Materials Research Society
Jagannath, C. ; Elman, B. ; Koteles, Emil S. ; Chen, Y. J. ; Brown, S. ; Armiento, C. A.
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Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.157-160, 1988. Pittsburgh, Pa.. Materials Research Society
Baccheschi, N. L. ; Brown, S. ; Kerekes, J. ; Schott, J.
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Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery XI : 28 March-1 April, 2005, Orlando, Florida, USA. pp.88-99, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Allameh, S.M. ; Soboyejo, W.O. ; Gally, B. ; Brown, S.
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Materials science of microelectromechanical systems (MEMS) devices III : symposium held November 27-28, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society