1.

Conference Proceedings

Conference Proceedings
Brown, G.J. ; Van Nostrand, J.E. ; Hedge, S.M. ; Siskaninetz, W. ; Xie, Q.-H.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.179-184,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
2.

Conference Proceedings

Conference Proceedings
Razeghi, M. ; Wei, Y. ; Gin, A. ; Brown, G.J. ; Johnstone, D.K.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.111-116,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
3.

Conference Proceedings

Conference Proceedings
Szmulowicz, F. ; Liu, H.C. ; Brown, G.J. ; Wasilewski, Z.R. ; Buchanan, M.
Pub. info.: Proceedings of the sixth International Symposium on Long Wavelength Infrared Detectors and Arrays: Physics and Applications.  pp.145-157,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-21
4.

Conference Proceedings

Conference Proceedings
Hoff, J. ; Kim, S. ; Erdtmann, M. ; Williams, R. ; Piotrowski, J. ; Bigan, E. ; Razeghi, M. ; Brown, G.J.
Pub. info.: Proceedings of the Third International Symposium on long wavelength infrared detectors and arrays : physics and applications III.  pp.119-125,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-28
5.

Conference Proceedings

Conference Proceedings
Hoff, J. ; Jelen, C. ; Slivken, S. ; Erdtmann, M. ; Brown, G.J. ; Bigan, E. ; Razeghi, M.
Pub. info.: Proceedings of the Third International Symposium on long wavelength infrared detectors and arrays : physics and applications III.  pp.110-118,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-28
6.

Conference Proceedings

Conference Proceedings
Manasreh, M.O. ; Brown, G.J.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.809-814,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
7.

Conference Proceedings

Conference Proceedings
Brown, G.J. ; Mitchel, W.C.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.157-162,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
8.

Conference Proceedings

Conference Proceedings
Brown, G.J. ; Taferner, W.T. ; Hedge, S.M. ; Eyink, K.G. ; Szmulowicz, F. ; Mitchel, W.C. ; Solomon, J. ; Walck, S.D.
Pub. info.: Proceedings of the Fifth International Symposium on Long Wavelength Infrared Detectors and Arrays: Physics and Applications.  pp.240-253,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-33
9.

Conference Proceedings

Conference Proceedings
Szmulowicz, F. ; Brown, G.J.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.158-166,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
10.

Conference Proceedings

Conference Proceedings
Brown, G.J. ; Houston, S. ; Szmulowicz, F. ; Mahalingam, K. ; Haugan, H. ; Wei, Y. ; Gin, A. ; Razeghi, M.
Pub. info.: Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA.  pp.191-198,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5074