1.

Conference Proceedings

Conference Proceedings
Wagner,J. ; Ramsteiner,M. ; Ashwin,M.J. ; Fahy,M.R. ; Newman,R.C. ; Braun,W. ; Ploog,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.259-264,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Bayer,M. ; Braun,W. ; Baars,T. ; Forchel,A. ; Reinecke,T.L. ; Walck,S.N. ; Schmitt,O.M. ; Banyai,L. ; Haug,H.
Pub. info.: Ultrafast Phenomena in Semiconductors II.  pp.119-127,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3277