Correlation of inspection methods in characterizing nanomachined photomask repairs
- Author(s):
- Csuy, J.E. ( RAVE LLC (USA) )
- Bozak, R.R. ( RAVE LLC (USA) )
- Terrill, L. ( RAVE LLC (USA) )
- White, R. ( RAVE LLC (USA) )
- Nishida, N. ( HOYA Corp. (Japan) )
- Publication title:
- Photomask and Next-Generation Lithography Mask Technology XI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5446
- Pub. Year:
- 2004
- Page(from):
- 375
- Page(to):
- 383
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453693 [0819453692]
- Language:
- English
- Call no.:
- P63600/5446.1
- Type:
- Conference Proceedings
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